AYUSH KUMAR OJHA. AI-augmented fault detection and diagnosis in VLSI circuits: A step toward intelligent chip design. Journal of Artificial Intelligence,Machine Learning and Neural Network , [S. l.], v. 4, n. 02, p. 139–146, 2024. DOI: 10.55529/jaimlnn.46.39.46. Disponível em: https://hmjournals.com/journal/index.php/JAIMLNN/article/view/4973. Acesso em: 13 jun. 2026.