AYUSH KUMAR OJHA. AI-Augmented Fault Detection and Diagnosis in VLSI Circuits: A Step toward Intelligent Chip Design. Journal of Artificial Intelligence,Machine Learning and Neural Network , [S. l.], v. 4, n. 6, p. 39–46, 2024. DOI: 10.55529/jaimlnn.46.39.46. Disponível em: https://hmjournals.com/journal/index.php/JAIMLNN/article/view/4973. Acesso em: 12 mar. 2025.